Index Symbols | A | B | C | D | E | F | G | H | I | J | L | M | N | O | P | Q | R | S | T | U | W Symbols 1. Acceptance 10. Requirement 11. Spacecraft 12. Space segment 13. System 14. Test 15. Validation 16. Verification 17. Failure Modes and Effects Analysis(FMEA) 18. Failure Modes, Effects and Criticality Analysis (FMECA) 19. Process FMECA (PFMECA) 2. Anomaly 20. Mechanism 3. Common cause failure 4. Equipment/unit 5. Failure 6. Failure mode 7. Mechanical part 8. Part/component 9. Quality A AC AD AEC AEC-Q AECMA AF AOCS AR ARINC ASIC B Bayesian inference BGA BiCMOS BR BS BTI C CAMP CCD CCF CCS CDR CECC CERDIP CLT CMOS CNES Contributing factor COTS CoV CPGA CPLD CRM CRR CTE CV D DAG DC DD Deep Sub Micron DEG Degradation failure DEP Design FMEA DET DFMEA DHS DoE DRAM DSM DSP E Ea ECSS EEE EEE part EEPROM EIA ELR EM EMC Epistemic uncertainty EPPL EPROM ESA ESD ETA EX Extrinsic failure F Failure mechanism Failure mode and effects summary FMES Failure root cause FCV FDIR FET FIT FMD FMEA FMECA FMES FOO FORM FPGA FR FRR FTA G GaAs GaN GEO H Handbook data source HCI HDBK HET HPA HW I I_SA IC IEC IEEE IGBT In-orbit return (IOR) data Interface IOR IOT IPC J JAN JANS JANTX JANTXV JEDEC JEP JESD JFET L LCD LED LEO Level of confidence LMS LoC LRR LV M Manufacturer data MC MCCV MCM MCMC MCR MCS MDR MEC Mechanical component MEO MIL MIS Miscellaneous item Mission lifetime MMIC MMOD MMPDS Model uncertainty MoM MOS MOSFET MPM MTBF MTTF MW N N-STD NA NaN NASA NASDA NDE NEA New space NIST NMOS NPRD NRPM NSWC O O O/O OCC OLR ORR P PAL PBGA PCB PDF PDR PEN Pertinence PFMEA PHEMT Physics of Failure PL POD PoF PPS Probability density function PROM PROP PRR PT PTFE PTH PWR PYRO Q QA QR R RAMS Random failure RBD REF Reliability prediction Reliability prediction method Reliability prediction methodology Reliability prediction model Reliability prediction space application RF RP RPDSM RPN RUL RW S S/N SA SADM SAE Safe life qualification SCC SCU SDIP SEB SEE SEL SEP SEU SEV SF Si SiGe Simplified structural reliability method SM SMD SnPb SORM SPF SRAM SRM SRR SSPA Statistical method Statistical uncertainty STD STN STRU Structural reliability method Sudden failure SW SYS System engineering Systematic failure T TDDB Technological limits (TBC) Test data TFT THER TID TM TMI TN TNID TRL TTC TTF TVS TWTA U UTE UV W Wear-out failure
